BISTel Presents at the APC Conference XXVIII (US)
BISTel, together with Qorvo, a leading supplier of RF solutions for mobile, network infrastructure, and aerospace/defense applications, presented several papers at the Advanced Process Control (APC) Conference XXVIII, held in Phoenix Arizona in October 2016.
As an invited speaker, BISTel presented an innovative approach that improves the accuracy and usability of manufacturing fault detection. The topic piqued the interest of Solid State Technology magazine, which led to an interview with the presenter, Tom Ho. The magazine plans to publish an article on the topic in an upcoming issue.
During the conference, BISTel also shared with the audience customer testimonials and use cases demonstrating the capabilities and effectiveness of BISTel’s FDC and data analytics solutions.
BISTel is a Platinum sponsor of this annual technical conference, which brings together engineers and industry experts to share ideas, technology trends, and advanced solutions in the semiconductor and display manufacturing industries.