BISTel, as a Platinum sponsor exhibitor, will attend APC conference 2018 which will be held from October 8-11 at Austin Airport Hilton Hotel in Austin, Texas.
The APC conference (www.apcconference.com) is a leading advanced manufacturing event built around tutorials and technical presentations that address the needs and solutions for the semiconductor and related industries that require high-precision manufacturing.
BISTel will be presenting four papers in this year’s technical sessions. As the Platinum Conference Sponsor, we’ll be talking about the latest cutting-edge technology; the Next-generation Fault Detection and Analytic platform, and the way manufacturing factories to be a true smart manufacturing environment will be also discussed.
Come visit BISTel and learn how our innovative solutions can help you take the next step towards achieving Smart Manufacturing and exceed your goals.
The full session agenda is now available here: http://bit.ly/2P1oozB
As for the technical session agenda BISTel attending, see below.
Tuesday, October 9, 2018
3:30 PM | Fault Detection Virtual Metrology Session | Session Chairs: Mark Yelverton, BISTel & Yulei Sun, Rudolph Technologies
4:30 PM | Achieving Consistent Process Performance Through Chamber Matching Using Full Trace Analytics | Jason Clark, BISTel
Wednesday, October 19, 2018
3:30 PM | Smart Manufacturing for Semiconductor: A Perspective | Tom Ho, BISTel
2:00 PM | Solving Parametric Drift Issues Through Trace-level Chamber Analysis | Mark Yelverton, BISTel & Mohamed Boumerzoug, NXP
2:30 PM | The Value and Effectiveness of Sensor Trace Analytics in Solving Yield Impact Issues: A Case Study | Kim Kok Gan, BISTel
We look forward to seeing you there!