• May 11, 2017

BISTel to Present Next-Gen FDC solution at ASMC 2017

1807-ASMC

BISTel to Present Next-Gen FDC solution at ASMC 2017

BISTel to Present Next-Gen FDC solution at ASMC 2017 1024 576 BISTel

BISTel will present its latest fault detection solution at the 2017 Advanced Semiconductor Manufacturing Conference (ASMC) which takes place May 15 through May 18 at the Saratoga Hilton in Saratoga Springs, New York.

Come and learn about how this innovative FDC solution can help you significantly reduce deployment and maintenance time while increasing detection accuracy and efficiency.

ASMC is the leading international technical conference for exploring solutions to improve the collective micro-electronics manufacturing expertise. The conference, with technical sponsorship from IEEE EDS and CPMT provides an unparalleled platform for semiconductor professionals to network and learn the latest information in the practical application of advanced manufacturing strategies and methodologies.

For more information about this event, please visit:  http://www.semi.org/en/asmc2017

Share this entry