• October 27, 2017

BISTel to Present and Exhibit at AEC/APC Symposium Asia 2017


BISTel to Present and Exhibit at AEC/APC Symposium Asia 2017

1024 777 BISTel

Come join us at the AEC/APC Symposium, November 15th, at the National Center of Sciences Building in Tokyo, Japan.

At this year’s event, BISTel is scheduled to present both in the technical tutorial as well as the interactive poster session. Our presentation topics include:

  • An innovation approach to assessing wafer inventory quality in real-time using FDC data
  • A practical approach to reducing false alarms using our latest fault detection solution

As a platinum sponsor, BISTel will also be exhibiting at the event. Come talk to our staff and learn how BISTel’s suite of Manufacturing Intelligence solutions can help you achieve Industry 4.0 and exceed your manufacturing goals.

The AEC/APC Symposium is an annual event that brings together leading device makers, equipment and software suppliers, and technology leaders to share and discuss the latest scientific manufacturing technologies and trends. Many of the technologies introduced in past conferences have helped improve productivity and yield in various industries including semiconductor, LCD, and PV.

For more information on AEC/APC Symposium Asia 2017, please visit:

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