BISTel will participate as a sponsor and a presenter at this year’s European APC|M Conference which is being held on April 16 through April 18 in Dresden, Germany.
Two presentations are scheduled to be presented by BISTel:
- Real-time Wafer Inventory Quality Assessment Using FDC Data
- Practical Approach to Further Reducing False Alarms in Dynamic Fault Detection
We invite you to join us and learn how our innovative solutions can help you increase productivity and maximize revenue. Representatives from BISTel will be present throughout the event for product discussions and to answer any questions.
The APC|M conference is an annual event aimed to provide a forum for the high-tech manufacturing community to share information on topics related to challenges and future needs in Advanced Process Control and Manufacturing Effectiveness.
For more information about this event, please visit: https://www.apcm-europe.eu/home/