• March 24, 2017

BISTel to Present at the 17th Annual APC|M Conference

1806-APC_M

BISTel to Present at the 17th Annual APC|M Conference

BISTel to Present at the 17th Annual APC|M Conference 1024 576 BISTel

BISTel will present its latest advanced fault detection solution at this year’s European Advanced Process Control and Manufacturing Conference (APC|M) which is being held on April 10 – April 12 in Dublin, Ireland.

This conference is aimed to provide a forum for the high-tech manufacturing community to share information on topics related to challenges and future needs in Advanced Process Control and Manufacturing Effectiveness.

Come visit our exhibition booth (co-hosted with our partner znt – Zentren für Neue Technologien GmbH) and let us show you how we could help you maximize the productivity and efficiency of your manufacturing plant.

For more information on the APC|M conference:  http://www.apcm-europe.eu/home/

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