• December 5, 2016

BISTel to present at ISSM 2016 in Tokyo, Japan

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BISTel to present at ISSM 2016 in Tokyo, Japan

BISTel to present at ISSM 2016 in Tokyo, Japan 1024 576 BISTel

BISTel will present its latest advanced fault detection solution at the 2016 International Symposium on Semiconductor Manufacturing (ISSM) held on December 12 – 13.   The innovative solution and its practical use cases will be showcased in the poster presentation session on December 13 at the KFC Hall in Ryogoku, Tokyo, JAPAN.

BISTel is a silver sponsor of this year’s ISSM event which aims to provide a global forum for sharing semiconductor manufacturing technology “best practices”.  For more information about the event, please visit:  https://www.semiconportal.com/issm/

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