• December 19, 2016

BISTel’s Next Generation Solution Highlighted in Semiconductor Trade Article

BISTel’s Next Generation Solution Highlighted in Semiconductor Trade Article

BISTel’s Next Generation Solution Highlighted in Semiconductor Trade Article 1024 576 BISTel

Semiconductor Manufacturing & Design magazine recently published an article highlighting several papers presented at the October APC conference in Phoenix, AZ.   These papers, presented by leading semiconductor manufacturing suppliers such as BISTel, Intel, and Applied Materials, focus on innovative approaches to address FDC modeling challenges and to improve FDC efficiency.

The article references BISTel’s upcoming Dynamic Full Trace FDC product and highlights it as one of the solutions that can dramatically improve usability and accuracy of a fault detection system.

To read the full article, click on the following link:

http://semimd.com/blog/2016/11/22/process-control-deals-with-big-data-busy-engineers/

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