BISTel once again proudly sponsoring the 31st Advanced Process Control Conference (APC), 28th~31th October in San Antonio, Texas. Find out more about our recent advances in Trace Analytics as well as industry-proven customer use cases from NXP and Qorvo this year. Find us on booth and bunch of presentations there!
Tuesday, October 29, 2019
1:00pm | Track B(Majestic Ballroom B) | Overcoming Challenges in Root Cause Analysis with Trace Analytics, Jim Bird, NXP Semiconductors, KK Gan, Joe Lee, Mark Yelverton, BISTel 19034
4:00pm | Track B(Majestic Ballroom B) | Improving Time-To-Decision with AI in Semiconductor Manufacturing, Gabe Villareal, Joe Lee, Tom Ho, BISTel 19044
Wednesday, October 30, 2019
11:30am | Track A(Majestic Ballroom A) | Leveraging the Benefits of Cloud Analytics in Semiconductor – A Real-time Application Case Study, Eric McCormick, Vinh Nguyen, Qorvo, Gabe Villareal, Joe Lee, Tom Ho, BISTel 19026